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Download Advanced Computing in Electron Microscopy by Earl J. Kirkland PDF

By Earl J. Kirkland

Advanced Computing in Electron Microscopy, 2d variation, brings jointly various details on picture simulation. a useful source, this e-book presents info on a number of equipment for numerical computation of excessive solution traditional and scanning transmission electron microscope photos. this article will function a useful gizmo for college students on the complicated undergraduate or graduate point, in addition to skilled researchers within the box.

This greater moment variation contains:

-descriptions of latest advancements within the field

-updated references

-additional fabric on aberration corrected tools and confocal electron microscopy

-expanded and stronger examples and sections to supply superior clarity

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Additional resources for Advanced Computing in Electron Microscopy

Example text

13. It is interesting to compare an aberration corrected probe and an uncorrected probe [232]. 14 shows a probe at 100 keV with and without an aberration corrector. The curves are normalized to have the same integrated current. It is very surprising that the corrected probe is dramatically higher than the uncorrected probe. The tails of the probe at large radius have a very large contribution to the total current even though they appear small in this type of graph. An aberration corrector can increase the image contrast a lot more than might be expected.

D. Russell, Electron Microscopy, Princ. and Tech. , 1999 [36] 3. D. K. Bowen and C. R. Hall, Microscopy of Materials, MacMillan Press, 1975 [35] 4. M. De Graf, Intro. to Conventional Transmission Electron Microscopy, Cambridge Univ. Press, 2003 [129] 5. J. W. Edington, Practical Electron Microscopy in Materials Science, Van Nostrand Reinhold, 1976 [87] 6. B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, Springer, 2001 [120] 7. C. E. Hall, Introduction to Electron Microscopy, 2nd edition, McGraw-Hill, 1966 [141] 8.

4 of O’Neil [275] for balancing 3rd and 5th order spherical aberrations) and Black and Linfoot [30] and including annular objective apertures (for example Barakt and Houston [18]). 5 Fig. 2 Source Size The probe is just the image of the electron source, which can also contribute to the probe size. 72) where j is the current density in the probe and α is the convergence half angle (πα 2 is the solid angle). Brightness is conserved in a magnetic lens but may vary with beam energy. Various condenser lenses and the objective lens are used to demagnify the image of the source onto the specimen.

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